Atmel CAMELIA 8M Manual de usuario descargar pdf (Pagina 12)

CAMELIACOL 8M user guide

12/16 V 2.0 - October 2001

8.3 IMAGE GRADE SPECIFICATION

8.3.1 DEFINITIONS

♦ Defect sizes

◊ Blemish : 1 x 1 defect.

◊ Cluster : blemish grouping of not more than a given number of adjacent defects :

1 x 1 < cluster 1 size ≤ 2 x 2

2 x 2 < cluster 2 size ≤ 5 x 5

◊ Column : one-pixel-wide column with more than 15 contiguous defective pixels.

◊ Defect separation : Defects are separated by no less than "D min" pixels in any direction.

♦ Defects in darkness

◊ blemish or cluster : pixel(s) whose signal deviate(s) more than 150 ADU *.

◊ Column : column whose signal deviates more than 15 ADU *.

♦ Defects under illumination

◊ blemish or cluster : pixel(s) which deviate(s) by more than 20 % from the "average" pixel

◊ column : column which deviates by more than 10 % from the "average" column.

* ADU : Arbitrary Digital Unit : 12 bits correspond to 4095 ADUs. Deviations specified with CDS gain = 1.

8.3.2 DEFECT TEST CONDITIONS

♦ Room temperature = 20

♦ Integration time in darkness = 100ms

♦ Light source : Halogen 3200K with BG38 (2mm thick) IR cut- off with f/3.5 aperture

♦ Test under illumination at 50% of saturation level

♦ No software correction performed

8.3.3 CLASSIFICATIONS

**** P R E L I M I N A R Y D A T A ****

Blemishes Cluster 1 Cluster 2 Column

Grade Total D min Total D min Total D min Total D min

≤ 1000

≤ 50

≤ 4

150

≤ 5

150

≤ 600

≤ 16

70 0 - 0 -

1 2 ... 7 8 9 10 11 12 13 14 15 16

Sin comentarios

Atmel CAMELIA 8M Manual de usuario Pagina 12